Quasi-TEM spectral domain approach for calculating distributed inductance and resistance of microstrip on Si-SiO2 substrate

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Quasi-TEM spectral domain approach for calculating distributed inductance and resistance of microstrip on Si-SiO2 substrate

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A quasi-TEM spectral domain approach based on the vector magnetic potential equation to calculate frequency dependent distributed inductance and the associated distributed series resistance of a microstrip on Si-SiO2 substrate is presented. It is shown that the calculated frequency dependent inductance and the associated resistance are in good agreement with the results obtained from rigorous full wave solutions.

Inspec keywords: microstrip lines; silicon; silicon compounds; inductance; electric resistance; UHF integrated circuits; spectral-domain analysis; substrates; CMOS integrated circuits

Other keywords: Si-SiO2 substrate; microstrip; distributed inductance; frequency dependent inductance; quasi-TEM spectral domain approach; SiO2; distributed series resistance; CMOS RFICs; Si-SiO2; vector magnetic potential equation

Subjects: Waveguides and microwave transmission lines; Microwave integrated circuits; CMOS integrated circuits

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