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Statistical power estimation of CMOS logic circuits with variable errors

Statistical power estimation of CMOS logic circuits with variable errors

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A statistical power estimation method is proposed where estimation time and accuracy can be balanced by assigning smaller (higher) errors to the nodes with higher (lower) power dissipation. To determine the errors, a quadratic programming based problem is formulated. Experimental results show a drastic reduction in the number of simulation patterns, compared to previous methods.

References

    1. 1)
      • Cirit, M.A.: `Estimating dynamic power consumption of CMOS circuits', IEEE Proc. Int. Conf.Computer Aided Design, 1987, p. 534–537.
    2. 2)
      • Xakellis, M., Najm, F.N.: `Statistical estimation of the switching activity in digital circuits', ACM/IEEE Proc. Design Automation Conf., 1994, p. 728–733.
    3. 3)
      • R. Burch , F.N. Najm , P. Yang , T. Trick . A Monte Carlo approach for power estimation. IEEETrans. Very Large Scale Integr. Syst. , 1 , 63 - 71
    4. 4)
      • Brglez, F., Fujiwara, H.: `A neutral netlist of 10 combinational benchmark circuits and a targettranslator in fortran', IEEE International Symp. on Circuits and Systems, 1985, p. 695–698.
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