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Evaluation of spatial Green's functions for microstrips: fast Hankel transform algorithm and complex image method

Evaluation of spatial Green's functions for microstrips: fast Hankel transform algorithm and complex image method

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The fast Hankel transform (FHT) algorithm and complex image method (CIM) are employed to evaluate the spatial-domain Green's function for a multilayered microstrip structure. The results are compared with those obtained by exact numerical integration. It is found that both techniques have high efficiency and the FHT has better accuracy than the CIM.

References

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      • Hsieh, R.C., Kuo, J.T.: `Fast full-wave characterization of arbitraryplanar microstrip geometries', Asia Pacfic Microwave Conference, December 1997, Hong Kong, p. 685–688.
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      • N.B. Christensen . Optimized fast Hankel transform filters. Geophys. Prospect. , 545 - 568
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      • Y.L. Chow , J.J. Yang , D.H. Fang , G.E. Howard . A closed-form spatial Green's function for the thick microstrip substrate. IEEE Trans. Microw. Theory Tech. , 588 - 592
    4. 4)
      • Webb, D.B., Mittra, R.: `Practical implementation of the complex imagemethod for the solution of nonplanar multilayered media problems', Proc. IEEE-APS Int. Symp., July 1996, Baltimore, Maryland, p. 420–423.
    5. 5)
      • M.I. Aksun . A robust approach for the derivation of closed-form Green'sfunctions. IEEE Trans. Microw. Theory Tech. , 651 - 658
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