For access to this article, please select a purchase option:
IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.
Your recommendation has been sent to your librarian.
An experimental investigation of dynamic lasing characteristics in oxide-confinement InGaAs/GaAs vertical-cavity surface-emitting lasers (VCSELs) grown on GaAs(311)A substrates is presented. A stable single polarisation mode was exhibited along the [2̄33] crystallographic direction under continuous wave (CW) operation and under high-speed direct modulation with a data rate of 1 Gbit/s.
Inspec keywords: gallium arsenide; laser modes; optical communication equipment; surface emitting lasers; laser stability; laser cavity resonators; semiconductor lasers; indium compounds; light polarisation; III-V semiconductors
Other keywords:
Subjects: Optical communication; Lasing action in semiconductors; Optical communication devices, equipment and systems; Laser resonators and cavities; Design of specific laser systems; Semiconductor lasers; Laser resonators and cavities