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Efficient algorithm for untestable path detection

Efficient algorithm for untestable path detection

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The authors present an algorithm for detecting untestable paths in multi-level circuits. By constructing equivalent normal form (ENF) for reconvergent paths only, the proposed algorithm detects and removes untestable paths efficiently in terms of run-time and memory usage.

References

    1. 1)
      • C. Sequin . (1991) Advanced research in VLSI.
    2. 2)
      • S. Devadas , K. Keutzer . Synthesis of robust delay-fault-testablecircuits: Theory. IEEE Trans. Comput. Aid. Design. , 1 , 87 - 101
    3. 3)
      • D. Armstrong . On finding a nearly minimal set of fault detection testsfor combinational logic nets. IEEE Trans. , 2 , 66 - 73
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