Your browser does not support JavaScript!
http://iet.metastore.ingenta.com
1887

Self-heterodyne coherent optical frequency-domain reflectometer

Self-heterodyne coherent optical frequency-domain reflectometer

For access to this article, please select a purchase option:

Buy article PDF
$19.95
(plus tax if applicable)
Buy Knowledge Pack
10 articles for $120.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

A high sensitivity coherent optical frequency-domain reflectometer (OFDR) is presented, for measurements of pigtailed optical devices with centimetre resolution. Unique interpretation of the reflectivity data is achieved by frequency shifting the reference reflection and using optical heterodyne detection.

References

    1. 1)
      • K. Takada , T. Kitagawa , M. Shimisu , M. Horiguchi . High sensitivity low coherence reflectometer using erbium doped superfluorescentfibre and erbium doped amplifier. Electron. Lett. , 365 - 367
    2. 2)
      • R. Passy , N. Gisin , J.P. von der Weid . High-sensitivity-coherent optical frequency-domain reflectometry forcharacterization of fiber-optic network components. Photonics Technol. Lett. , 6 , 667 - 669
    3. 3)
      • U. Glombitza , E. Brinkmeyer . Coherent frequency domain reflectometry for characterization of singlemode integrated optical waveguides. J. Lightwave Technol. , 8 , 1377 - 1384
    4. 4)
      • H.H. Gilgen , R.P. Novak , R.P. Salathé , W. Hodel , P. Beaud . Submillimeter optical reflectometry. J. Lightwave Technol. , 8 , 1225 - 1233
    5. 5)
      • R. Passy , N. Gisin , J.P. von der Weid , H.H. Gilgen . Experimental and theoretical investigation of coherent OFDR with semiconductorlaser sources. J. Lightwave Technol. , 9 , 1622 - 1630
    6. 6)
      • W. Eickhoff , R. Ulrich . Optical frequency domain reflectometry in single-mode fibre. Appl. Phys. Lett. , 9 , 693 - 695
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19951358
Loading

Related content

content/journals/10.1049/el_19951358
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address