A new technique (based on a extension of the six-port reflectometer procedure) is used to measure the scattering coefficients of two-port devices. Only six power sensors are required, as opposed to a total of eight for the dual-reflectometer scheme. Tests confirm that the nine-port instrument based on this technique is able to yield reasonably good measurement accuracies.
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http://iet.metastore.ingenta.com/content/journals/10.1049/el_19941333
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