Thermal impedance measurement of semiconductor lasers

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Thermal impedance measurement of semiconductor lasers

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Methods of measuring thermal impedance of lasers have traditionally compared devices under CW and pulsed current operation where it is assumed that heating is negligible for the latter. This assumption is untrue as heating still occurs within the duration of the current pulse. The authors describe an improved method for the measurement of thermal impedance.

Inspec keywords: laser variables measurement; semiconductor lasers; thermal resistance measurement

Other keywords: heating; pulsed current operation; semiconductor lasers; current pulse duration; thermal impedance measurement; CW operation

Subjects: Lasing action in semiconductors; Thermal variables measurement; Semiconductor lasers; Thermal instruments and techniques; Optical variables measurement

References

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      • A. P. Wright , B. Garrett , G. H. B. Thompson , J. E. A. Whiteaway . Influence of carrier transport on wavelength chirp of InGaAs/InGaAsPMQW Lasers. Electron. Lett. , 1911 - 1913
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      • B. S. Bhumbra , R. W. Glew , P. D. Greene , G. D. Henshall , C. M. Lowney , J. E. A. Whiteaway . High power operation of GaInAsP/GaInAs MQW ridge lasers emitting at 1.48µm. Electron. Lett. , 1755 - 1756
    3. 3)
      • T. L. Paoli . A new technique for measuring the thermal impedance of junction lasers. IEEE J. Quantum Electron. , 498 - 503
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