© The Institution of Electrical Engineers
A double mesa Si/SiGe heterojunction bipolar transistor (HBT) was developed for application in integrated circuits. The HBT is characterised by an emitter base heterojunction and consequently by a high base doping concentration. By using these transistors an integrated digital circuit, a multiplexer, was implemented. The measured bit rate of this first Si/SiGe HBT circuit was 16Gbit/s.
References
-
-
1)
-
J.D. Cressler
.
Sub-30-ps ECL circuit operation at liquid-nitrogen temperature using self-aligned epitaxial SiGe-base bipolar transistors.
IEEE Electron Device Lett.
,
166 -
168
-
2)
-
F. Sato
.
(1992)
Sub-20psec ECL circuits with 50GHz fmax Selfaligned SiGe HBTs, IEDM Tech. Dig..
-
3)
-
H.-U. Schreiber ,
J.N. Albers ,
B.G. Bosch
.
11.4Gbit/s silicon bipolar multiplexer IC employing 2μm lithography transistors.
Electron. Lett.
,
1684 -
1685
-
4)
-
D. Clawin ,
U. Langmann ,
H.-U. Schreiber
.
5-Gbit/s Si integrated regenerative demultiplexer and decision circuit.
IEEE J. Solid-State Circuits
,
385 -
389
-
5)
-
H.-U. Schreiber
.
High-speed double mesa Si/SiGe heterojunction bipolar transistor fabricatedby selfalignment technology.
Electron. Lett.
,
485 -
487
-
6)
-
Schreiber, H.-U., Bosch, B.G.: `Si/SiGe heterojunction bipolar transistors with current gains up to 5000', IEDM Tech. Dig., 1989, p. 643–646.
-
7)
-
Bussmann, M.: `A 12.5Gb/s Si bipolar IC for PRBS generation and bit error detection up to 25Gb/s', Tech. Dig. IEEE Solid-State Circuits Conf., 1993, p. 152–153.
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19931468
Related content
content/journals/10.1049/el_19931468
pub_keyword,iet_inspecKeyword,pub_concept
6
6