Ga0.8In0.2As/GaAs/Ga0.51In0.49P buried ridge structure single quantum well laser emitting at 0.98 μm

Access Full Text

Ga0.8In0.2As/GaAs/Ga0.51In0.49P buried ridge structure single quantum well laser emitting at 0.98 μm

For access to this article, please select a purchase option:

Buy article PDF
£12.50
(plus tax if applicable)
Buy Knowledge Pack
10 articles for £75.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

The first fabrication is reported of a buried ridge structure Ga0.8In0.2As/GaAs/Ga0.51In0.49P laser emitting at 0.98μm grown by two-step low pressure metal organic chemical vapour deposition. The width of the ridge is 2μm. Laser output power greater than 40mW with a threshold current of 30mA has been measured. A typical quantum efficiency of η 60% was obtained without any facet coating. Excellent homogeneity and uniformity have been achieved over a wafer area of 10cm2.

Inspec keywords: semiconductor growth; gallium arsenide; III-V semiconductors; vapour phase epitaxial growth; gallium compounds; optical workshop techniques; semiconductor junction lasers; optical waveguides; indium compounds; laser transitions

Other keywords: metal organic chemical vapour deposition; threshold current; 30 mA; 40 mW; 0.98 micron; SQW semiconductor laser; quantum efficiency; 60 percent; buried ridge structure; output power; fabrication; low pressure MOCVD; single quantum well laser; Ga0.8In0.2As-GaAs-Ga0.51In0.49P

Subjects: Semiconductor lasers; Epitaxial growth; Chemical vapour deposition; Optical fabrication, surface grinding; Lasing action in semiconductors; Design of specific laser systems

References

    1. 1)
      • M. Razeghi , M. Defour , F. Omnes , M. Dobers , J.P. Vieren , Y. Guldner . Extremely high electron mobility in a GaAs–GaInP heterostructure grown by MOCVD. Appl. Phys. Lett. , 5
    2. 2)
      • F. Omnes , M. Razeghi . Optical investigations of GaAs–GaInP QWs and superlattices grown by MOCVD. Appl. Phys. Lett. , 1034 - 1037
    3. 3)
      • R.I. Laming , M.C. Farries , P.R. Morkel , L. Reekie , D.N. Payne , P.L. Scrivener , F. Fontana , A. Righetti . Efficient pump wavelengths of erbium-doped fibre optical amplifier. Electron. Lett. , 12 - 14
    4. 4)
      • Y.K. Chen , M.C. Wu , J.M. Kuo , M.A. Chin , A.M. Sergent . Self-aligned InGaAS/GaAS/InGaP quantum well lasers prepared by gas-source molecular beam epitaxy with two growth steps. Appl. Phys. Lett. , 23
    5. 5)
      • M. Razeghi , M. Defour , R. Blondeau , F. Omnes , P. Maurel , O. Archer , F. Brillouet , J.C. C-Fan , J. Salerno . First cw operation of a Ga0.25In0.75As0.5P0.5InP laser on a silicon sub-strate. Appl. Phys. Lett. , 24
    6. 6)
      • M. Ohkubo , A. Ijichi , T. Kikata . High power 1.017-μm strained-layer quantum well lasers grown by metal organic chemical-vapor deposition. Appl. Phys. Lett. , 12
    7. 7)
      • M. Yamada , M. Shimizu , T. Takeshita , M. Okayasu , M. Horiguchi , S. Uehara , E. Sugita . Er3+-doped fiber amplifier pumped by 0.98 μm laser diodes. IEEE Photonics Technol. Lett. , 12
    8. 8)
      • M. Razeghi , R. Blondeau , K. Kazmierski , M. Krakowski , J.P. Duchemin . Very low threshold buried ridge structure lasers emitting at 1.3 μ grown by low pressure metalorganic chemical vapour deposition. Appl. Phys. Lett. , 2
    9. 9)
      • M. Razeghi , F. Omnes , J. Nagle , M. Defour , O. Acher , P. Bone . High purity GaAS layers grown by LP-MOCVD. Appl. Phys. Lett. , 1677 - 1679
    10. 10)
      • Omnes, F., Razeghi, M.: `Recent advances on GaAS–GaInP multiquantum wells grown by MOCVD on GaAs InP and silicon substrates', Proc. Materials for Photonic Devices, Workshop at Giardini Naxos (Taormina), 27th–31st May 1991, Italy.
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19920959
Loading

Related content

content/journals/10.1049/el_19920959
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading