Your browser does not support JavaScript!
http://iet.metastore.ingenta.com
1887

Novel loss measurement technique for optical waveguides by imaging of scattered light

Novel loss measurement technique for optical waveguides by imaging of scattered light

For access to this article, please select a purchase option:

Buy article PDF
£12.50
(plus tax if applicable)
Add to cart
Buy Knowledge Pack
10 articles for £75.00
(plus taxes if applicable)
Add to cart

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

© The Institution of Electrical Engineers
Published

A novel technique is presented measuring propagation losses in optical waveguides by imaging the scattered intensity on a video camera. This technique requires no special sample preparation and is independent of the light coupling efficiency to the waveguide.

Inspec keywords: television applications; closed circuit television; optical testing; optical waveguides; light scattering; optical loss measurement

Other keywords: propagation losses; loss measurement technique; nondestructive measurement; Si substrate; glass waveguide; scattered light imaging; optical waveguides; video camera; independent of coupling efficiency

Subjects: Optical variables measurement; Optical instruments and techniques; Optical waveguides; Optical testing techniques; Closed circuit television; Optical waveguides and couplers

References

    1. 1)
      • R.G. Walker . Simple and accurate loss measurement technique for semiconductor optical waveguides. Electron. Lett. , 581 - 583
    2. 2)
      • A.F. Evans , D.G. Hall , W.P. Maszara . Propagation loss measurements in silicon-on-insulator optical waveguides formed by the bond-and-etchback process. Appl. Phys. Lett. , 1667 - 1669
    3. 3)
      • J. Werner , E. Kapon , A.C. von Lehmen , R. Bhat , E. Colas , N.G. Stoeffel , S.A. Schwarz . Reduced optical waveguide losses of a partially disordered GaAs/AIGaAs single quantum well laser structure for photonic integrated circuits. Appl. Phys. Lett. , 1693 - 1695
    4. 4)
      • M. Erman , N. Vodjdani , J.B. Theeten , J.P. Cabanie . Low loss waveguides grown on GaAs using localized vapor phase epitaxy. Appl. Phys. Lett. , 894 - 895
    5. 5)
      • R.G. Walker , R.C. Goodfellow . Attenuation measurements on MOCVD-grown GaAs/GaAlAs optical waveguides. Electron. Lett. , 590 - 592
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19920368
Loading

Related content

content/journals/10.1049/el_19920368
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
Print this page
This is a required field
Please enter a valid email address