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access icon free Erratum: Electron beam controlled latch operating under electron beam testing conditions

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© The Institution of Electrical Engineers
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Inspec keywords: flip-flops; electron beam applications; logic testing

Other keywords: electron beam switching; latch; electron beam testing; electron beam control; E-beam sensitivity

Subjects: Logic and switching circuits; Logic circuits

http://iet.metastore.ingenta.com/content/journals/10.1049/el_19920274
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Errata
This article contains an Erratum to the following content:
Electron beam controlled latch operating under electron beam testing conditions
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