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Microwave properties of free-standing dielectric films

Microwave properties of free-standing dielectric films

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© The Institution of Electrical Engineers
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Measurement of the broadband (15–150 GHz) microwave dielectric properties of free-standing films is demonstrated using the technique of coherent microwave transient spectroscopy. The accuracy of the method is verified by experiments on a fused silica sheet whose dielectric properties are well known. Results of measurements on (∼200μm thick) polymer films are presented.

Inspec keywords: microwave measurement; polymer films; dielectric thin films; silicon compounds; microwave spectroscopy

Other keywords: fused silica sheet; 15 to 150 GHz; free-standing dielectric films; polymer films; coherent microwave transient spectroscopy; microwave dielectric properties

Subjects: Dielectric materials and properties; Microwave measurement techniques

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