Microwave properties of free-standing dielectric films

Microwave properties of free-standing dielectric films

For access to this article, please select a purchase option:

Buy article PDF
(plus tax if applicable)
Buy Knowledge Pack
10 articles for $120.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Your details
Why are you recommending this title?
Select reason:
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

Measurement of the broadband (15–150 GHz) microwave dielectric properties of free-standing films is demonstrated using the technique of coherent microwave transient spectroscopy. The accuracy of the method is verified by experiments on a fused silica sheet whose dielectric properties are well known. Results of measurements on (∼200μm thick) polymer films are presented.


    1. 1)
      • J.H. Lupinsk , R.S. Moor . (1989) , Polymeric materials for electronics packaging and interconnection.
    2. 2)
      • G.L. PattoN . 75-GHz fr SiGe-base heterojunction bipolar transistors. IEEE Electron. Device Lett. , 171 - 173
    3. 3)
      • G. Arjavalingam , Y. Pastol , J.-M. Halbout , G.V. Kopcsay . Broad-band microwave measurements with transient radiation from optoelectronically pulsed antennas. IEEE Trans. , 615 - 621
    4. 4)
      • Y. Pastol , G. Arjavalingam , J.-M. Halbout , G.V. Kopcsay . Absorption and dispersion of low-loss dielectrics measured with microwave transient radiation. Electron. Lett. , 523 - 524
    5. 5)
      • D.C. Edelstein , R.B. Romney , M. Scheuermann . Rapid programmable 300 ps optical delay scanner and signal-averaging system for ultrafast measurements. Rev. Sci. Instrum. , 579 - 583
    6. 6)
      • A.R. von Hippel . (1954) , Dielectric materials and applications.
    7. 7)
      • S. Herminghaus , D. Boese , D.Y. Yoon , B.A. Smith . Large anisotropy in optical properties of thin polyimide films of poly (pphenylene biphenyltetra-carboxamide). Appl. Phys. Lett. , 1043 - 1045

Related content

This is a required field
Please enter a valid email address