Lower bound of sample word length in bit/digit serial architectures

Lower bound of sample word length in bit/digit serial architectures

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In bit/digit-serial architectures the allowable sample word length is lower-bounded to synchronise the feedback loops (the cycles) correctly. A systematic procedure for finding this lower bound and the critical cycle that achieves the bound are described. From this information a successful schedule can be guaranteed for all cases, which has been difficult using previous approaches.


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