Noncontact electro-optic sampling with a GaAs injection laser

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Noncontact electro-optic sampling with a GaAs injection laser

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30 ps pulses from a diode laser have been used to perform noncontact electric field measurements using a versatile ‘finger probe’ electro-optic sampling technique.

Inspec keywords: electric field measurement; measurement by laser beam; III-V semiconductors; semiconductor junction lasers; electro-optical devices; gallium arsenide

Other keywords: 30 ps pulses; substrate-independent probing geometry; noncontact electric field measurements; semiconductor laser; electro-optic sampling system

Subjects: Laser beam applications; Other electric variables measurement; Velocity, acceleration and rotation measurement; Electro-optical devices; Laser applications; Optical variables measurement

References

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      • P. Torphammar , S.T. Eng . Picosecond pulse generation in semiconductor lasers using resonance oscillation. Electron. Lett. , 587 - 589
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      • K.E. Meyer , G.A. Mourou . (1985) Two-dimensional , Picosecond electronics and optoelectronics.
    3. 3)
      • J.A. Valdmanis , G. Mourou , C.W. Gabel . Picosecond electro-optic sampling system. Appl. Phys. Lett. , 211 - 212
    4. 4)
      • P.-T. Ho , L.A. Glasser , E.P. Ippen , H.A. Haus . Picosecond pulse generation with a cw GaAlAs laser diode. Appl. Phys. Lett. , 241 - 242
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Addendum: Noncontact electro-optic sampling with a GaAs injection laser