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New method to measure facet reflectivity of antireflection (AR)-coated laser diodes and LEDs

New method to measure facet reflectivity of antireflection (AR)-coated laser diodes and LEDs

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© The Institution of Electrical Engineers
Published

The facet reflectivity of AR-coated laser diodes and LEDs can be obtained by measuring the reflected optical power from the Fabry-Perot cavity formed by the flat end of a single-mode fibre and the diode facet. The relative error is estimated to be less than 10%. The estimation was based on the measurements on a conventional and an AR-coated 1.3 μm InGaAsP BH laser diode and the theoretical consideration of the light beam divergence and the angle misalignment of the cavity.

Inspec keywords: optical variables measurement; antireflection coatings; indium compounds; light emitting diodes; reflectometry; laser cavity resonators; III-V semiconductors; semiconductor junction lasers; gallium arsenide

Other keywords: InGaAsP; antireflection coated devices; buried heterostructure; laser diodes; reflected optical power measurement; facet reflectivity; single-mode fibre; angle misalignment; 1.3 microns wavelength; LEDs; semiconductor lasers; Fabry-Perot cavity; BH diode; light beam divergence

Subjects: Light emitting diodes; Laser resonators and cavities; Optical variables measurement; Laser resonators and cavities; Semiconductor lasers; Optical refractometry and reflectometry; Lasing action in semiconductors

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