New application of a single six-port reflectometer

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New application of a single six-port reflectometer

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© The Institution of Electrical Engineers
Published

Based on the wave-superposition principle and the equivalent-circuit principle, a new circuit of a single six-port reflectometer is designed. It may be used for measuring any two-port device. The method of calibration and measurement of the circuit is given.

Inspec keywords: calibration; microwave reflectometry; network analysers

Other keywords: six-port reflectometer; wave-superposition principle; microwave measurement; calibration; two port device measurement; equivalent-circuit principle

Subjects: Other instrumentation and measurement systems; Microwave measurement techniques

References

    1. 1)
      • D. Woods . Analysis of a dual-six-port network analyser and derivation of calibration equations. IEE Proc. A , 541 - 548
    2. 2)
      • A.L. Cullen . Measurement of 2-port devices by a reflectometer system. IEE Proc. H, Microwaves, Opt. & Antennas , 333 - 337
    3. 3)
      • S.H. Li , R.G. Bosisio . Calibration of multiport reflectometers by means of four open/short circuits. IEEE Trans. , 1085 - 1090
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