Processing of unipolar diodes with electron beams

Access Full Text

Processing of unipolar diodes with electron beams

For access to this article, please select a purchase option:

Buy article PDF
£12.50
(plus tax if applicable)
Buy Knowledge Pack
10 articles for £75.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

Low-energy ion implantation and multiple-scan electron-beam annealing have been used to produce bulk unipolar camel diodes and Schottky diodes with a range of barrier heights. Optimisation of results required precise doping and diffusion control.

Inspec keywords: Schottky-barrier diodes; electron beam applications; annealing; ion implantation; semiconductor diodes

Other keywords: unipolar diodes; electron-beam annealing; Schottky diodes; barrier heights; doping control; low energy ion implantation; diffusion control; camel diodes

Subjects: Junction and barrier diodes; Semiconductor doping

References

    1. 1)
      • J.M. Shannon . Appl. Phys. Lett.. Appl. Phys. Lett. , 369 - 371
    2. 2)
      • K. Board . (1982) Microelectron. J..
    3. 3)
      • J.M. Shannon . Appl. Phys. Lett.. Appl. Phys. Lett. , 63 - 65
    4. 4)
      • J.M. Shannon , J.A.G. Slatter . Jpn. J. Appl. Phys.. Jpn. J. Appl. Phys. , 259 - 262
    5. 5)
      • G.B. McMillan , J.M. Shannon , H. Ahmed , J. Narayan , W.L. Brown , R.A. Lemons . (1983) , Laser-solid inter-action and transient thermal processing of materials.
    6. 6)
      • J.M. Shannon . Solid-State Electron.. Solid-State Electron. , 537 - 543
    7. 7)
      • E. Kohn , U. Mishra , L.F. Eastman . IEEE Electron Device Lett.. IEEE Electron Device Lett.
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19840586
Loading

Related content

content/journals/10.1049/el_19840586
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading