Direct electro-optic sampling of transmission-line signals propagating on a GaAs substrate

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Direct electro-optic sampling of transmission-line signals propagating on a GaAs substrate

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© The Institution of Electrical Engineers
Published

We report a new picosecond electro-optic sampling probe suitable for noncontact electronic characterisation of high-speed monolithic GaAs integrated circuits.

Inspec keywords: monolithic integrated circuits; strip lines; probes; gallium arsenide; integrated circuit testing; electro-optical devices; substrates

Other keywords: transmission-line signals; monolithic GaAs integrated circuits; GaAs substrate; picosecond electrooptic sampling probe; noncontact electronic characterisation; microstrip transmission line

Subjects: Semiconductor integrated circuits; Waveguides and microwave transmission lines; Electro-optical devices

References

    1. 1)
      • Kolner, B.H., Kafka, J.D., Bloom, D.M., Baer, T.M.: `Compression of mode-locked Nd:YAG pulses to 1.8 picoseconds', Proceedings of topical meeting on ultrafast phenomena, 12–15 June 1984, Monterey, California, Springer-Verlag, , to be published.
    2. 2)
      • B.H. Kolner , D.M. Bloom , P.S. Cross . Picosecond optical electronic measurements. Proc. SPIE , 149 - 152
    3. 3)
      • B.H. Kolner , D.B. Bloom , P.S. Cross . Electro-optic sampling with picosecond resolution. Electron. Lett. , 574 - 575
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