Low resistance alloyed ohmic contacts to Al0.48In0.52As/n+-Ga0.47In0.53As

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Low resistance alloyed ohmic contacts to Al0.48In0.52As/n+-Ga0.47In0.53As

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A low ohmic contact resistance metallurgy and associated alloy cycles have been developed for applications to Al0.48In0.52As/Ga0.47In0.53As MODFETs (HEMTs). The metallurgy involves sequentially evaporated Ni/Ge/Au/Ag/Au layers followed by transient thermal alloy cycles. This resulted in low transfer resistances ∼0.06 Ωmm to the underlying GalnAs layer for alloying temperatures to ∼480°C.

Inspec keywords: ternary semiconductors; III-V semiconductors; aluminium compounds; ohmic contacts; germanium alloys; metallisation; silver alloys; semiconductor technology; indium compounds; gallium arsenide; nickel alloys; Schottky gate field effect transistors; gold alloys

Other keywords: low ohmic contact resistance metallurgy; alloy cycles; HEMTs; Ni-Ge-Au-Ag alloy; underlying GaInAs layer; low resistance ohmic contacts; alloying temperatures; MODFETs; metallisation; ternary compound semiconductors; evaporated Ni/Ge/Au/Ag/Au layers; transient thermal alloy cycles; MESFET

Subjects: Contact resistance, contact potential, and work functions; Metallisation and interconnection technology; Semiconductor-metal interfaces; Electrical conductivity of II-VI and III-V semiconductors; Electrical properties of metal-nonmetal contacts; II-VI and III-V semiconductors; Lithography (semiconductor technology); Other field effect devices

References

    1. 1)
      • R. Dingle , H.L. Stormer , A.C. Gossard , W. Weigmann . Electron mobilities in modulation-doped semiconductor heterojunction superlattices. Appl. Phys. Lett. , 665 - 667
    2. 2)
      • J. Barnard , H. Ohno , C.E.C. Wood , L.F. Eastman . Integrated double heterostructure Ga0.47In0.53As photoreceiver with automatic gain control. IEEE Electron Device Lett. , 7 - 9
    3. 3)
      • Oliver, J.D., Eastman, L.F.: `Growth and characterization of high purity lattice matched GaInAs on InP', 21st Electronic Materials Conference, 1979, Colorado.
    4. 4)
      • S. Bandy , C. Nishimoto , S. Hyder , C. Hooper . Saturation velocity determination for In0.53Ga0.47As field effect transistors. Appl. Phys. Lett. , 817 - 819
    5. 5)
      • N. Braslau , J.B. Gunn , J.L. Staples . Metal-semiconductor contacts for GaAs bulk effect devices. Solid Slate Electron. , 381 - 383
    6. 6)
      • G.K. Reeves , H.B. Harrison . Obtaining the specific contact resistance from transmission line model measurements. IEEE Electron Device Lett. , 111 - 113
    7. 7)
      • Mukherjee, S.D., Zwicknagl, P., Lee, H., Lepore, A., Eastman, L.F.: `As', Paper presented at WOCSEMMAD, 20–21 February 1984, San Francisco.
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