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Probe correction in near field measurements by pseudo sampling technique

Probe correction in near field measurements by pseudo sampling technique

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© The Institution of Electrical Engineers
Published

This letter describes an application of the pseudo sampling technique to the near-field far-field measurements taking into account the influence of the probe. This technique allows the reduction of the measured data and, consequently, the storage requirements and the computer time. The method can be applied to the computation of the probe position error bypassing the difficulty of mechanical scanning.

Inspec keywords: electric field measurement; antenna radiation patterns; probes

Other keywords: near field measurements; electric field measurement; far-field pattern determination; pseudo sampling technique; probe position error; antenna radiation patterns

Subjects: Voltage measurement; Antenna theory

References

    1. 1)
      • D.T. Paris , W.M. Leach , E.B. Joy . Basic theory of probe compensated measurements. IEEE Trans. , 373 - 379
    2. 2)
      • D'Elia, G., Leone, G., Pierri, R.: `A new approach in the near-field–far-field transformation', Proc. of the IEEE-APS Symposium, 1983, , p. 495–498.
    3. 3)
      • O.M. Bucci , G. Franceschetti . The role of the sampling in antenna measurements, Eindhoven 1982 Summer School on Communication Satellite Technology.
    4. 4)
      • D'Elia, G., Leone, G., Pierri, R.: `Near field-far field transformation by pseudo sampling expansion', Proceedings of the International Conference on Antennas and Propagation, 1983, Norwich, England, p. 108–112.
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