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An investigation is reported into the electrical properties of palladium/silicon oxide/n-type silicon Schottky-barrier-type structures. On exposure to hydrogen a large increase in the DLTS signal is observed. This is thought to be associated with the production of electron trapping centres. Analysis reveals the presence of two traps, both located near the silicon surface.
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http://iet.metastore.ingenta.com/content/journals/10.1049/el_19820214
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