http://iet.metastore.ingenta.com
1887

Temperature dependence of storage time in silicon p+-n-n+ switching diodes and reduction of harmonic distortion

Temperature dependence of storage time in silicon p+-n-n+ switching diodes and reduction of harmonic distortion

For access to this article, please select a purchase option:

Buy article PDF
$19.95
(plus tax if applicable)
Buy Knowledge Pack
10 articles for $120.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

Using the reverse-recovery technique, storage times in p+-n-n+ diodes have been measured as a function of temperature. In all cases the effective lifetime for injected charge increases with increasing temperature within the interval 0 to 180°C. This result was found to reduce second-harmonic distortion in p+-n-n+ switches by as much as 6 dB at 2.5 MHz.

References

    1. 1)
      • Martinelli, R.U., Rosen, A.: `Storage time variations in silicon ', IEDM Tech. Dig., 1979, p. 556.
    2. 2)
      • M. Byczkowski , J.R. Madigan . Minority carrier lifetime in p-n junction devices. J. Appl. Phys.
    3. 3)
      • H.J. Kuno . Analysis and characterization of p-n junction diode switching. IEEE Trans.
    4. 4)
      • D. Leenov . The silicon PIN diode as a microwave radar protector at megawatt levels. IEEE Trans.
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19800049
Loading

Related content

content/journals/10.1049/el_19800049
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address