© The Institution of Electrical Engineers
The usefulness of Se-Ge inorganic photoresists as ion-implantation masks is described. Experimentally determined values of the projected range and range straggling are in agreement with theory. The required masking thickness is shown to be about ⅓ of that of organic photoresist. Other advantageous features are also pointed out.
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http://iet.metastore.ingenta.com/content/journals/10.1049/el_19790360
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