V.P.E. GaAs m.e.s.f.e.t. structure using oxygen injection during buffer layer growth

Access Full Text

V.P.E. GaAs m.e.s.f.e.t. structure using oxygen injection during buffer layer growth

For access to this article, please select a purchase option:

Buy article PDF
£12.50
(plus tax if applicable)
Buy Knowledge Pack
10 articles for £75.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

GaAs m.e.s.f.e.t. structures with high-resistivity buffer layers were prepared by introducing oxygen into the deposition system during growth. The electrical properties of the buffer layers are independent of the oxygen content of the gas phase over a large range of partial pressures. The characteristics of devices prepared with such layers are excellent.

Inspec keywords: Schottky gate field effect transistors; gallium arsenide; vapour phase epitaxial growth

Other keywords: GaAs; MESFET; deposition system; gas phase; buffer layer growth; VPE

Subjects: Other field effect devices; Epitaxial growth

References

    1. 1)
      • F.E. Rosztoczy , J. Konoshita . Growth and evaluation of epitaxial GaAs for microwave devices. J. Electrochem. Soc. , 439 - 444
    2. 2)
      • M.E. Weiner . Si contamination in open flow quartz systems for the growth of GaAs and GaP. J. Electrochem. Soc. , 496 - 504
    3. 3)
      • Barrera, J.: `The importance of substrate properties on GaAs FET performance', Proceedings of the 5th Biennial Cornell Electrical Engineering Conference, 1975, p. 135–144.
    4. 4)
      • E. Kohn , R. Wuller , R. Stahlmann , H. Beneking . High-speed 1 μm GaAs m.e.s.f.e.t.. Electron. Lett. , 171 - 172
    5. 5)
      • Nozaki, T., Ogawa, M., Terao, H., Watanabe, H.: `Multilayer epitaxial technology for the Schottky barrier GaAs field effect transistor', Proceedings of the 4th International Symposium on GaAs, 1974, p. 46–54, Inst. Phys. Conf. Ser. No. 24.
    6. 6)
      • G.B. Stringfellow , G. Hom . Hydride VPE growth of GaAs for FET's. J. Electrochem. Soc. , 1806 - 1811
    7. 7)
      • Esteve, J., Ponse, F., Bachem, K.-H.: To be published.
    8. 8)
      • P. Küpper , H. Bruch , M. Heyen , P. Balk . On the role of silicon during growth of VPE GaAs-layers. J. Electron. Mat. , 455 - 472
    9. 9)
      • Palm, L., Bruch, H., Bachem, K.-H., Balk, P.: To be published.
    10. 10)
      • K.-H. Bachem , M. Heyen . Vapor phase growth of thin GaAs multilayer structures. J. Electrochem. Soc. , 147 - 148
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19790174
Loading

Related content

content/journals/10.1049/el_19790174
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading