Very easily testable/diagnosable sequential machine

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Very easily testable/diagnosable sequential machine

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© The Institution of Electrical Engineers
Published

This letter is an extension of the works of Fujiwara et al. Based on the principle of machine modification through augmentation of extra inputs and outputs, it develops an approach of fault detection taking into consideration the faults occurring in the machine which may cause an increase in its number of states. Further, in this method, the checking sequence can also be reduced in length.

Inspec keywords: fault location; sequential machines; logic testing

Other keywords: testable diagnosable sequential machine; fault detection

Subjects: Logic design methods; Sequential switching theory

References

    1. 1)
      • Z. Kohavi , P. Lavallee . Design of sequential machines with fault-detection capabilities. IEEE Trans. , 475 - 484
    2. 2)
      • H. Fujiwara , Y. Nagao , T. Sasao , K. Kinoshita . Easily testable sequential machines with extra inputs. IEEE Trans. , 821 - 826
    3. 3)
      • S.I. Murakami , K. Kinoshita , H. Ozaki . Sequential machines capable of fault diagnosis. IEEE Trans. , 1079 - 1085
    4. 4)
      • S.C. Lee . (1976) , Digital circuits and logic design.
    5. 5)
      • S.R. Das , A. Bhattacharyya . Fault detection in sequential machines with increased fault coverage. Electron. Lett. , 28 - 29
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19790133
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