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Examination of grain boundaries in polycrystalline solar cells using a scanning optical microscope

Examination of grain boundaries in polycrystalline solar cells using a scanning optical microscope

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© The Institution of Electrical Engineers
Published

A scanning optical microscope in which the object is scanned mechanically is used to produce images from polycrystalline solar cells using both the reflected-light and photoinduced current modes.

Inspec keywords: laser beam applications; optical microscopy; solar cells; photoconductivity; semiconductor device testing; grain boundaries

Other keywords: reflected light images; photoinduced current modes; grain boundaries examination; polycrystalline solar cells; scanning optical microscope

Subjects: Photoelectric conversion; solar cells and arrays; Grain and twin boundaries; Photoconduction and photovoltaic effects; photodielectric effects; Optical microscopy; Solar cells and arrays

References

    1. 1)
      • C.J.R. Sheppard , T. Wilson . Image formation in scanning microscopes with partially coherent source and detector. Opt. Acta. , 315 - 325
    2. 2)
      • Sheppard, C.J.R., Gannaway, J.N., Walsh, D., Wilson, T.: `A scanning optical microscope for the inspection of electronic devices', Microcircuit engineering conference, 1978, Cambridge University.
    3. 3)
      • T. Wilson , W.R. Osicki , J.N. Gannaway , G.R. Booker . Comparison of dislocation images obtained using the scanning optical microscope and scanning electrical microscope.
    4. 4)
      • C.J.R. Sheppard , A. Choudhury . Image formation in the scanning microscope. Opt. Acta. , 1051 - 1073
    5. 5)
      • T.H. Distephano , J.J. Cuomo . Reduction of grain boundary recombination in polycrystalline silicon solar cells. Appl. Phys. Lett. , 351 - 353
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