© The Institution of Electrical Engineers
A new measurement technique is presented that uses a modification of standard S-parameter instrumentation to directly measure y-,z-,h- andg-parameters at microwave frequencies. The required open-circuit and short-circuit terminations are created by the appropriate simultaneous application of the test r.f. signal to both ports of the device under test. Experimental results indicate the possibility of using this approach to improve the accuracy of 2-port characterisations at microwave frequencies.
References
-
-
1)
-
Takayama, Y.: `A new load-pull characterization method for microwave power transistors', IEEE MTT-S International microwave symposium digest of technical papers, 1976, p. 218–220.
-
2)
-
K.L. Kotzebue
.
A new technique for the direct measurement of y-parameters at microwave frequencies.
IEEE Trans.
,
119 -
123
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19780305
Related content
content/journals/10.1049/el_19780305
pub_keyword,iet_inspecKeyword,pub_concept
6
6