OH-ion distribution profiles in rod preforms of high-silica optical waveguide

OH-ion distribution profiles in rod preforms of high-silica optical waveguide

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To investigate the OH-contamination mechanism in high-silica optical waveguide, we have measured optically OH-ion distribution profiles in rod preforms prepared by the c.v.d. technique. The contamination due to OH diffusion from the supporting silica tube was clarified in relation to the deposited barrier-glass-layer thickness.


    1. 1)
      • M. Horiguchi , H. Osanai . Spectral losses of low-OH-content optical fibres. Electron. Lett. , 310 - 312
    2. 2)
      • P. Kaiser , A.R. Tynes , H.W. Astle , A.D. Peason , W.G French , R.E. Jaeger , A.H. Cherin . Spectral losses of unclad vitercous silica and soda-lime-silicate fibers. J. Opt. Soc. Am. , 1141 - 1148
    3. 3)
      • T. Bell , G. Hetherington , K.H. Jack . Water in vitereous silica. Pt. 2—some aspects of hydrogen-water-silica equilibria. Phys. Chem. Glasses , 141 - 146

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