© The Institution of Electrical Engineers
High-energy, doubly charged selenium ions have been used to produce dopant profiles suitable for GaAs devices, such as f.e.t.s. Selenium has the advantage that beams of high purity may be formed.
References
-
-
1)
-
C.O. Bozler ,
J.P. Donnelly ,
R.A. Murphy ,
R.W. Laton ,
R.A. Sudbury ,
W.T. Lindley
.
High efficiency ion-implanted lo-hi-lo GaAs IMPATT diodes.
Appl. Phys. Lett.
-
2)
-
J.J. Berenz ,
R.S. Ying ,
D.H. Lee
.
C.W. operation of ion-implanted GaAs Read-type impatt diodes.
Electron. Lett.
,
157 -
158
-
3)
-
L.J. van der Pauw
.
A method of measuring specific resistivity and Hall effect of discs of arbitrary shape.
Phillips Res. Rep.
,
1
-
4)
-
B.J. Sealy ,
R.K. Surridge
.
A new thin film encapsulant for ion implanted GaAs.
Thin solid films
-
5)
-
T. Mizutani ,
S. Ishida ,
M. Fujimoto
.
GaAs field-effect transistors by selective sulphur-ion implantation.
Electron. Lett.
,
431 -
432
-
6)
-
R.G. Hunsperger ,
N. Hirsch
.
GaAs field-effect transistors with ion-implanted channels.
Electron. Lett.
,
577 -
578
-
7)
-
R.A. Pucel ,
D.J. Massé ,
C.F. Krumm
.
Noise performance of gallium arsenide field-effect transistors.
J. Solid-State Circuits
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19770169
Related content
content/journals/10.1049/el_19770169
pub_keyword,iet_inspecKeyword,pub_concept
6
6