Harding, W.R.; Blenkinsop, I.D.; Wight, D.R.: 'Dislocation-limited minority-carrier lifetime in <i>n</i>-type GaP', Electronics Letters, 1976, 12, (19), p. 503-504, DOI: 10.1049/el:19760381
IET Digital Library, https://digital-library.theiet.org/;jsessionid=65q4dp6kt42tc.x-iet-live-01content/journals/10.1049/el_19760381