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Large-microstrip-step-discontinuity model useful to 10 GHz

Large-microstrip-step-discontinuity model useful to 10 GHz

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The effect of field fringing at microstrip impedance steps is shown to be representable by a Section of lossy microstrip transmission line. The experimental solution for the step-model parameters is described. Specific results are presented for much used 0-0635 cm-thick alumina substrates.

References

    1. 1)
      • Matthaei , Young , Jones . (1974) , Microwave filters, impedance matching networks, and coupling Structures.
    2. 2)
      • R.E. Neidert , G.T. O'Reilly . Very large impedance steps in microstrip. IEEE Trans. , 808 - 810
    3. 3)
      • Bianco , Granara , Ridella . Filtering properties of two-dimensional lines discontinuities. Alta Freq. , 6
    4. 4)
      • Howell . A quick accurate method to measure the dielectric constant of MIC substrates. IEEE Trans. , 3 , 142 - 143
    5. 5)
      • O'Reilly, G. T., Neidert, R. E.: `Computer program for increasing the accuracy of impedance measurements performed with a Hewlett Packard manual network analyzer', 2676, Memorandum Report, 1973.
    6. 6)
      • Schneider . Microstrip dispersion. Proc. Inst. Elec. Electron. Eng. , 144 - 146
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