Comparison of noise parameters of diffused and ion-implanted microwave transistors

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Comparison of noise parameters of diffused and ion-implanted microwave transistors

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Two types of implanted microwave transistor structures are outlined, and their behaviour is compared with a totally diffused device. Minimum noise figures for the implanted transistors have been obtained in the range 3.6–4.5 dB at a frequency of 4 GHz.

Inspec keywords: ion implantation; solid-state microwave devices; bipolar transistors; noise

Other keywords: noise; ion implantation; 4 GHz; solid state microwave devices; bipolar transistors

Subjects: Solid-state microwave circuits and devices; Semiconductor doping; Bipolar transistors

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