© The Institution of Electrical Engineers
Two types of implanted microwave transistor structures are outlined, and their behaviour is compared with a totally diffused device. Minimum noise figures for the implanted transistors have been obtained in the range 3.6–4.5 dB at a frequency of 4 GHz.
References
-
-
1)
-
K.H. Nicholas
.
Studies of anomalous diffusion of impurities in silicon.
Solid-State Electron
,
35 -
47
-
2)
-
H. Fukui
.
The noise performance of microwave transistors.
IEEE Trans.
,
329 -
341
-
3)
-
T.E. Seidel ,
I. Ruge ,
J. Graul
.
(1971)
Distribution of boron implanted silicon, Ion-implantation in semiconductors.
-
4)
-
R.B. Fair
.
Profile estimation of high-concentration arsenic diffusions in silicon.
J. Appl. Phys.
,
1278 -
1280
-
5)
-
S.D. Malaviya ,
A. van der Ziel
.
A simplified approach to noise in microwave transistors.
Solid-State Electron.
,
1511 -
1518
-
6)
-
K.H. White ,
M.O. Thruston
.
Characterization of microwave transistors.
Solid-State Electron
,
523 -
542
-
7)
-
M.K. Barnoski ,
D.D. Loper
.
Microwave characteristics of ion-implanted bipolar transistors.
Solid-State Electron
,
441 -
451
-
8)
-
W.S. Johnson ,
J.F. Gibbons
.
(1969)
, Projected range statistics.
-
9)
-
H. Rothe ,
W. Dahlke
.
Theory of noisy fourpoles.
Proc. Inst. Radio Eng.
,
811 -
818
-
10)
-
A.U. Macrae
.
Device fabrication by ion implantation.
Radiat. Eff.
,
59 -
73
-
11)
-
J.A. Archer
.
Design and performance of small-signal microwave transistors.
Solid-State Electron.
,
249 -
258
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19740030
Related content
content/journals/10.1049/el_19740030
pub_keyword,iet_inspecKeyword,pub_concept
6
6