Power-generation potential of various IMPATT structures from a scaling approximation
The power potential of the double-drift and both complementary 1-sided silicon IMPATTS is estimated as a function of frequency, using a scaling approximation that accounts for the dependence of generation efficiency on bias-current density. The results show the n+–p junction IMPATT to be a superior choice for reliable power generation below 25 GHz, owing to its relatively low threshold-current density.