Accurate algorithm for temperature calculation of devices in nonlinear-circuit-analysis programs

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Accurate algorithm for temperature calculation of devices in nonlinear-circuit-analysis programs

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© The Institution of Electrical Engineers
Published

An exact method is given for the temperature determination of devices in circuits analysed by nonlinear-circuit-analysis programs. The method is based on the simultaneous solution of the electronic and thermal network equations by introducing the ‘thermal-node’ temperatures as well as the node voltages. These voltages and temperatures are arranged in a joint state vector.

Inspec keywords: nonlinear network analysis; temperature measurement; thermal effects

Other keywords: nonlinear circuit analysis; thermal effects model; device temperature calculation

Subjects: Thermal variables measurement; Nonlinear network analysis and design

References

    1. 1)
      • Tarnay, K., Székely, V.: `TRANZ-TRAN nemlineáris áramköranalizis program', Third conference on electronic instrumentation and measurement techniques, 1972, Budapest.
    2. 2)
      • O. Müller . Der Einfluss des Mitlaufens der Collectorsperrschicht-temperatur auf das Wechselstromverhalten des Transistors (Mittlauf-effekt). Arch. Elek. Übertrag. , 13 - 28
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