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Frequency dependence of negative-capacitance effects observed in amorphous semiconductor thin-film devices

Frequency dependence of negative-capacitance effects observed in amorphous semiconductor thin-film devices

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A simple thermal model is analysed which explains the observed frequency dependence of the negative capacitance of chalcogenide-glass threshold switches at room temperature.

References

    1. 1)
      • W.W. Sheng , C.R. Westgate . On the pre-switching phenomena in semiconducting glasses. Solid State Commun. , 387 - 391
    2. 2)
      • R. Vogel , P.J. Walsh . Negative capacitance in amorphous semiconductor chalcogenide thin films. Appl. Phys. Lett. , 216 - 218
    3. 3)
      • P.J. Walsh , R. Vogel , E.J. Evans . Conduction and electrical switching in amorphous chalcogenide semiconductors. Phys. Rev.
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