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Impairment of noise immunity of digital monolithic integrated circuits caused by supply-line and earth-line current spikes in conjunction with coaxial-cable connections

Impairment of noise immunity of digital monolithic integrated circuits caused by supply-line and earth-line current spikes in conjunction with coaxial-cable connections

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Voltage fluctuations generated on the common supply and earth lines of a digital system are caused mainly by capacitances of interconnecting coaxial cables and the self inductances of these common lines. This impairment of noise immunity can be eliminated by the addition of proper integrated m.o.s. capacitances.

References

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      • Abdel-Latif, M., Strutt, M.J.O.: `Verfahren und Vorrichtung zur Verringerung der Störanfälligkeit von integrierten Schaltkreisen', Swiss, , 8 January 1970, Patent Application.
    2. 2)
      • M. Abdel-Latif , M.J.O. Strutt . Simple graphical method to determine line reflections between high-speed-logic integrated circuits. Electron Lett. , 496 - 498
    3. 3)
      • M. Abdel-Latif , M.J.O. Strutt . A new integrated gate eliminating line reflections in high-speed digital systems. Proc. Inst. Elect. Electron. Engrs. , 936 - 938
    4. 4)
      • W.J. Hosier . Noise susceptibility of integrated circuits in digital systems. Radio Electron. Engrs. , 291 - 298
    5. 5)
      • M. Abdel-Latif , M.J.O. Strutt . Noise immunity in monolithic digital integrated circuits. Scientia Electrica , 77 - 94
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