Your browser does not support JavaScript!
http://iet.metastore.ingenta.com
1887

Simple graphical method for calculating the efficiency of bulk negative-resistance microwave oscillators

Simple graphical method for calculating the efficiency of bulk negative-resistance microwave oscillators

For access to this article, please select a purchase option:

Buy article PDF
£12.50
(plus tax if applicable)
Buy Knowledge Pack
10 articles for £75.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

A graphical method is given for calculating the efficiency of a bulk negative-resistance microwave oscillator. It is shown that, for a square-wave r.f. signal, InP 3-level oscillators should have an efficiency of over 20% at fields only twice threshold, and In0.2Ga0.8Sb oscillators should give an efficiency of over 35%

References

    1. 1)
      • W.K. Kennedy , L.F. Eastman , R.J. Gilbert . LSA operation of large volume bulk GaAs samples. IEEE Trans. , 500 - 504
    2. 2)
      • C. Hilsum , H.D. Rees . Three-level oscillator: a new form of transferred-electron device. Electron. Lett. , 277 - 278
    3. 3)
      • C. Hilsum , J.B. Mullin , B.A. Prew , H.D. Rees , B.W. Straughan . Instabilities of InP 3-level transferred-electron oscillators. Electron. Lett. , 307 - 308
    4. 4)
      • J.E. Carroll . Criteria for the assessment of transferred-electron materials. Electron. Lett. , 393 - 394
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19700315
Loading

Related content

content/journals/10.1049/el_19700315
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address