Diffusion in semiconductors

Access Full Text

Diffusion in semiconductors

For access to this article, please select a purchase option:

Buy article PDF
£12.50
(plus tax if applicable)
Buy Knowledge Pack
10 articles for £75.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

When the concentration of diffusing impurity in a semiconductor approaches or exceeds the intrinsic concentration of electrons or holes at the temperature of diffusion, the resulting partial differential equation becomes nonlinear. A computer program has been prepared to obtain the profile of the diffused impurity for such a situation.

References

    1. 1)
      • A.S. Grove . (1967) , Physics and technology of semiconductor devices.
    2. 2)
      • F.M. Smits . Formulation of junction structures by solid state diffusion. Proc. Inst. Radio Engrs. , 1049 - 1061
    3. 3)
      • J. Crank . (1956) , The mathematics of diffusion.
    4. 4)
      • R.B. Adler , A.C. Smith , R.L. Longini . (1964) , Introduction to semi-conductor physics—Vol. 1.
    5. 5)
      • S.K. Ghandhi . (1968) , The theory and practice of microelectronics.
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19700257
Loading

Related content

content/journals/10.1049/el_19700257
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
Errata
An Erratum has been published for this content:
Erratum: Diffusion in semiconductors