© The Institution of Electrical Engineers
When the concentration of diffusing impurity in a semiconductor approaches or exceeds the intrinsic concentration of electrons or holes at the temperature of diffusion, the resulting partial differential equation becomes nonlinear. A computer program has been prepared to obtain the profile of the diffused impurity for such a situation.
References
-
-
1)
-
A.S. Grove
.
(1967)
, Physics and technology of semiconductor devices.
-
2)
-
F.M. Smits
.
Formulation of junction structures by solid state diffusion.
Proc. Inst. Radio Engrs.
,
1049 -
1061
-
3)
-
J. Crank
.
(1956)
, The mathematics of diffusion.
-
4)
-
R.B. Adler ,
A.C. Smith ,
R.L. Longini
.
(1964)
, Introduction to semi-conductor physics—Vol. 1.
-
5)
-
S.K. Ghandhi
.
(1968)
, The theory and practice of microelectronics.
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19700257
Related content
content/journals/10.1049/el_19700257
pub_keyword,iet_inspecKeyword,pub_concept
6
6