M.I.S. capacitance in heavy inversion

M.I.S. capacitance in heavy inversion

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The letter deals with a theoretical analysis of the different currents originating in an m.i.s. structure for a heavy inversion region of operation, when a transient low-level electrical perturbation is applied. The expression for the generation-recombination current in the space-charge region is fairly different from that generally used; it is emphasised that the recombination rate is not constant and not equal to ni/2τn in the whole thickness of the transition zone.


    1. 1)
      • S.R. Hofstein , G. Warfield . Physical limitations on the frequency response of a semiconductor surface inversion layer. Solid-Stale Electron. , 321 - 341
    2. 2)
      • A. Goetzberger , E.H. Nicollian . Temperature dependence of inversion layer frequency response in silicon. Bell. Syst. Tech. J. , 513 - 522
    3. 3)
      • L.M. Terman . An investigation of surface states at a silicon-silicon oxide interface employing metal-oxide-silicon diodes. Solid-State Electron. , 285 - 299
    4. 4)
      • D.J. Esteve . Expression du courant de recombinaison, issu de la zone de transition dans les jonctions PN + ou NP + abruptes. CR Acad. Sci. , 870 - 873
    5. 5)
      • S.R. Hofstein . Minority carrier lifetime determination from inversion layer transient response. IEEE Trans. , 785 - 786

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