Skin effect in microwave semiconductor diodes

Skin effect in microwave semiconductor diodes

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It is commonly assumed that the skin effect is the cause of an increase in the series resistance of a semiconductor diode at microwave frequencies. This letter presents some simple theoretical calculations which show that the validity of such an assumption is highly doubtful.


    1. 1)
      • A. Uhlir . The potential of semiconductor diodes in high frequency communications. Proc. Inst. Radio Engrs. , 1099 - 1115
    2. 2)
      • Shurmer, H.V.: `Intrinsic frequency limitations for semiconductor microwave devices', Proceedings of the joint symposium on microwave applications of semiconductors, 1965, , sections 2.1–2.4.
    3. 3)
      • J.A. Copeland . C.W. operation of l.s.a. oscillator diodes. Bell Syst. Tech. J. , 284 - 287
    4. 4)
      • C.E. Thompson . Microwave absorption and series resistance of silicon-mesa parametric-amplifier diodes. Proc. IEE , 2013 - 2018
    5. 5)
      • J.O. Scanlan , V.P. Kodali . Characterisation of tunnel diodes at microwave frequencies. Proc. IEE , 1231 - 1236
    6. 6)
      • S. Ramo , J.R. Whinnery , T. Vanduzer . (1965) , Fields and waves in communications electronics.
    7. 7)
      • J.A. Copeland . Doping uniformity and geometry of l.s.a. oscillator diodes. IEEE Trans. , 497 - 500

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