access icon free Active area optimisation of film bulk acoustic resonator for improving performance parameters

In this Letter, an active area optimisation technique to improve the performance parameters of the film bulk acoustic resonator (FBAR) is proposed. The active area of the back trench membrane-based FBAR is optimised to remove the spurious modes, higher harmonic modes, and to confine the acoustic signal at its central part during the resonance. The effect of thickness variation of SiO2 layer on the performance parameters was studied using finite-element analysis (FEA) simulation. The SiO2 film, on silicon substrate, was used as the support layer and zinc oxide was used as the piezoelectric film for the resonator. The authors have successfully demonstrated the FBAR through FEA for an optimised active area of 320 × 320 µm2, series resonance frequency (f s) 1.249 GHz, and parallel resonance frequency (f p) 1.273 GHz with an effective electromechanical coupling coefficient of 4.65%.

Inspec keywords: finite element analysis; zinc compounds; silicon compounds; bulk acoustic wave devices; piezoelectric thin films; acoustic resonators

Other keywords: FEA simulation; spurious modes; zinc oxide; ZnO; back trench membrane-based FBAR; frequency 1.249 GHz; electromechanical coupling coefficient; higher harmonic modes; finite-element analysis simulation; size 320 mum; film bulk acoustic resonator; SiO2; piezoelectric film; acoustic signal; series resonance frequency; frequency 1.273 GHz; active area optimisation technique; parallel resonance frequency

Subjects: Piezoelectric and ferroelectric materials; Finite element analysis; Sonic and ultrasonic equipment; Acoustic wave devices

References

    1. 1)
      • 11. Kaitila, J., Ylilammi, M., Ella, J., et al: ‘Spurious resonance free bulk acoustic wave resonators’. IEEE Symp. on Ultrasonics, 2003, vol. 1, pp. 8487.
    2. 2)
      • 5. Yang, D.Y., Kim, H.W.: ‘Film bulk acoustic resonator with improved lateral mode suppression’, U.S. Patent 6,693,500, 2004.
    3. 3)
    4. 4)
    5. 5)
      • 8. Thalhammer, R., Kaitila, J., Zieglmeier, S., et al: ‘4E-3 spurious mode suppression in BAW resonators’. IEEE Ultrasonics Symp., Vancouver, BC, Canada, 2006, pp. 456459.
    6. 6)
    7. 7)
      • 12. Kaitila, J.: ‘3C-1 review of wave propagation in BAW thin film devices-progress and prospects’. IEEE Symp. on Ultrasonics Proc., 2007, pp. 120129.
    8. 8)
    9. 9)
    10. 10)
    11. 11)
      • 9. Yakimenko, Y., Zazerin, A., Orlov, A., et al: ‘Film bulk acoustic resonator finite element model in active filter design’. IEEE Proc. 37th Int. Spring Seminar on Electronics Technology, Dresden, Germany, 2014, pp. 486490.
    12. 12)
    13. 13)
http://iet.metastore.ingenta.com/content/journals/10.1049/el.2020.1901
Loading

Related content

content/journals/10.1049/el.2020.1901
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading