RT Journal Article

PB iet
T1 interview
JN Electronics Letters
VO 55
IS 4
SP 166
OP 166
AB
DO https://doi.org/10.1049/el.2019.0342
UL https://digital-library.theiet.org/;jsessionid=v7biapfjq46v.x-iet-live-01content/journals/10.1049/el.2019.0342
LA English
SN 0013-5194
YR 2019
OL EN