access icon free Method to reduce an unwanted EM field component in a 4-port TEM cell

As an alternative standard electromagnetic (EM) field generator, a 4-port TEM (transverse EM) cell can be used for an EM compatibility (EMC) emission and immunity test. However, unwanted EM fields generated in a TEM cell deteriorate the results and accuracy of critical EMC tests. A new method to suppress unwanted field components in a 4-port TEM cell is proposed. To reduce the unwanted EM field, the narrow slits in internal septa are inserted, which are transverse with respect to the direction of wave propagation. By introducing the slits, the 4-port TEM cell can provide improved standard EM field distribution with the much-lowered unwanted field component inside the usable test volume.

Inspec keywords: TEM cells; immunity testing; electromagnetic wave propagation; electromagnetic compatibility

Other keywords: standard EM field distribution; standard EM field generator; EM compatibility emission; wave propagation direction; 4-port TEM cell; 4-port transverse EM cell; unwanted EM fields; unwanted field components; critical EMC tests; standard electromagnetic field generator; EMC immunity test; unwanted EM field component

Subjects: Production facilities and engineering; Electromagnetic compatibility and interference; Electromagnetic wave propagation

http://iet.metastore.ingenta.com/content/journals/10.1049/el.2017.4831
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