access icon free Modelling of the effective dielectric constant of planar spoof surface plasmon polariton waveguides

The modelling of the effective dielectric constant of a planar spoof surface plasmon polariton waveguide for X-band frequencies is presented. The waveguide has a single conductor structure that is corrugated on both sides. A methodology to extract the effective dielectric constant of waveguides with complex patterns and a novel closed-form formula based on complex analysis of the structure and empirical methods are suggested. The suggested formula is a function of the corrugation depth, aperture, periodicity, thickness of the substrate material and permittivity. The worst case error between the formula and measurement result is 8.4%, which is much lower than the previously reported coplanar stripline formulation approach having an error of 14.5%.

Inspec keywords: permittivity; polaritons; planar waveguides; surface plasmons; dielectric waveguides

Other keywords: X-band frequencies; aperture; permittivity; frequency 8 GHz to 12 GHz; closed-form formula; corrugation depth; periodicity; effective dielectric constant modelling; single conductor structure; substrate material thickness; worst case error; planar spoof surface plasmon polariton waveguides

Subjects: Waveguides and microwave transmission lines; Dielectric materials and properties

References

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http://iet.metastore.ingenta.com/content/journals/10.1049/el.2017.2360
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Correspondence
This article has following corresponding article(s):
accurate sSPP waveguide dielectric modelling