http://iet.metastore.ingenta.com
1887

Simulating the pre- and de-emphasis of drive voltages of silicon-based micro-ring ring-modulators

Simulating the pre- and de-emphasis of drive voltages of silicon-based micro-ring ring-modulators

For access to this article, please select a purchase option:

Buy article PDF
$19.95
(plus tax if applicable)
Buy Knowledge Pack
10 articles for $120.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

Integrated modulators are being intensely investigated and became potential candidates for the fundamental building blocks of next generation silicon-based front-end transceivers. Although suitable optical performance has been demonstrated in several works, theoretical models for the appropriate driving conditions of the micro-ring modulators are rarely explored. The carrier concentration fundamentally determines the refraction index of the pn junction of the modulator and to accelerate charge injection/extraction a pre- and de-emphasised driving voltage technique has been widely and successfully applied. Here we present a mathematical model where shooting amplitude and duration are considered with an optimised power consumption analysis. The model can be applied for both NRZ and RZ modulation formats.

References

    1. 1)
    2. 2)
    3. 3)
    4. 4)
    5. 5)
      • 5. Downing, A.J.N.: ‘Fiber optic communications’ (Cengage Learning, Australia, 2004, 1st edn.), p. 275.
    6. 6)
http://iet.metastore.ingenta.com/content/journals/10.1049/el.2016.3650
Loading

Related content

content/journals/10.1049/el.2016.3650
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address