Erozan, A. T.; Tavli, B.: 'High performance adjacent error detection for nanometer devices', Electronics Letters, 2016, 52, (21), p. 1788-1789, DOI: 10.1049/el.2016.3021
IET Digital Library, https://digital-library.theiet.org/;jsessionid=ee3bvnd5tsq9.x-iet-live-01content/journals/10.1049/el.2016.3021