PUF-based encryption method for IC cards on-chip memories

PUF-based encryption method for IC cards on-chip memories

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This Letter presents a self-controlled physical unclonable function (PUF) circuit and its application in encrypting on-chip memories of IC bank cards. The PUF circuit is based on cross-coupled NAND gates. Voting and Hamming code address the stability of its outputs. The Monte Carlo simulation and field-programmable gate array board are used for verification. The Voting method improves the error rate 79%. The Hamming codes and convertor can correct every error bits of PUF outputs. The PUF outputs, data address and time-stamp are encrypted by SM4 (Chinese block cipher algorithm standard) to generate KEY. The data does XOR with the KEY.


    1. 1)
      • 1. Gassend, B., Clarke, D., van Dijk, M., Devadas, S.: ‘Controlled physical random functions’. Processing 18th Annual Computer Security Applications Conf., Las Vegas, USA, December 2002, pp. 149160.
    2. 2)
      • 2. Su, Y., Holleman, J., Otis, B.: ‘A 1.6pj/bit 96% stable chip-ID generating circuit using process variations’. ISSCC, San Francisco, USA, February 2007, pp. 231232.
    3. 3)
    4. 4)
    5. 5)
      • 5. Sanu, K. Mathew, Sudhir, K., Satpathy, Mark A. Anders, Himanshu, Kaul: ‘A 0.19Pj/b PVT-variation-tolerant hybrid physically unclonable function circuit for 100% stable secure key generation in 22 nm CMOS’. ISSCC, San Francisco, USA, February 2014, pp. 178179.
    6. 6)
      • 6. Lee, J.W., Lim, D., Gassend, B., Suh, G.E., van Dijk, M., Devadas, S.: ‘A technique to build a secret key in ICs for ID and authentication applications’. IEEE Symp. VLSI Circuits, Honolulu, USA, June 2004, pp. 176179.
    7. 7)
    8. 8)
      • 8. Komurcu, G., Dündar, G.: ‘Determining the quality metrics for PUFs and performance evaluation of two RO-PUFs’. IEEE 10th Int. New Circuits and Systems Conf., (NEWCAS), Montreal, Canada, June 2012, pp. 7376.
    9. 9)
      • 9. Chopra, J.: ‘SRAM characteristics as physical unclonable functions’ (Worcester Polytechnic Institute Electric Project Collection, 2009).

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