Improved deterministic measurement model for consumer-grade accelerometers

Improved deterministic measurement model for consumer-grade accelerometers

For access to this article, please select a purchase option:

Buy article PDF
(plus tax if applicable)
Buy Knowledge Pack
10 articles for $120.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Your details
Why are you recommending this title?
Select reason:
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

Deterministic error modelling, calibration and model parameter estimation of consumer-grade accelerometers is considered and improvement to the traditionally used measurement model is proposed. Calibration experiments on a flight motion simulator are performed for experimental verification. Model parameters are estimated using the Levenberg-Marquardt optimisation algorithm. Residual errors are considerably reduced as a result of the improved measurement model.


    1. 1)
    2. 2)
    3. 3)
      • 3. MicroStrain, Williston, VT, USA: 3DM-GX2®Microstrain, 2015. Available at
    4. 4)
      • 4. Xsens Tech. BV: Enschede, The Netherlands, MTi and MTx User Manual and Technical Documentation, 2015. Available at
    5. 5)
      • 5. Press, W.H., Flannery, B.P., Teukolsky, S.A., Vetterling, W.T.: ‘Numerical recipes in C: the art of scientific computing’ (Cambridge University Press, Cambridge, UK, 1992, 2nd edn), pp. 681688.
    6. 6)
      • 6. Titterton, D.H., Weston, J.L.: ‘Strapdown inertial navigation technology’ (The American Institute of Aeronautics and Astronautics, Reston, VA, USA, 1979, 2nd edn).

Related content

This article has following corresponding article(s):
in brief
This is a required field
Please enter a valid email address